US Patent 7657696 Method to detect NAND-flash parameters by hardware automatically
Patent 7657696 was granted and assigned to LSI Corporation on February, 2010 by the United States Patent and Trademark Office.
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A method for automatically detecting a plurality of parameters for a NAND-Flash memory. A first step of the method may include generating a plurality of address cycles for the NAND-Flash memory. A second step may set an address number parameter of the parameters based on (i) a first number of the address cycles generated and (ii) a status signal generated by the NAND-Flash memory responsive to the address cycles. A third step generally includes generating at least one read cycle for the NAND-Flash memory after determining the address number parameter. A fourth step may set a page size parameter of the parameters based on (i) a second number of the read cycles generated and (ii) the status signal further responsive to the read cycles.
US Patent 07657696 Method to detect NAND-flash parameters by hardware automatically US Patent 7657696 Method to detect NAND-flash parameters by hardware automatically
US Patent 07657696 Method to detect NAND-flash parameters by hardware automatically
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