Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
February 23, 2010
Patent Application Number
11912872
Date Filed
May 23, 2005
Patent Primary Examiner
Patent abstract
A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
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