Patent attributes
Provided is a test system that tests a device under test, the test system including: a test head that includes a test module that generates a test signal to be supplied to the device under test; a performance board that is mounted above the test head and conveys the test signal generated by the test module; and a daughter unit that is detachably mounted to the performance board, and conveys the test signal from the performance board to the device under test, where the daughter unit includes: a socket to which the device under test is mounted; a daughter board to which the socket is mounted; and an enclosure that accommodates therein the socket and the daughter board, and includes a daughter-unit shield that cuts off noise from outside with respect to the socket and the daughter board.
