US Patent 7697928 System and method for device testing
Patent 7697928 was granted and assigned to Freescale Semiconductor on April, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 31, 2006
0
Date of Patent
April 13, 2010
0
Patent Application Number
11513365
0
Patent Inventor Names
William M. Shvodian
0
Eric H. Boll
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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