Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kanak B. Agarwal0
Dhruva J. Acharyya0
Date of Patent
April 13, 2010
0Patent Application Number
119465710
Date Filed
November 28, 2007
0Patent Primary Examiner
Patent abstract
Measurement of individual quiescent supply currents from multiple power supply pads located across a semiconductor die provides a means of characterizing across-die variation. A ratio is created by combining the individual pad supply current with the sum of all pad supply currents for a given die. An n-tuple is formed from the set of ratios for all pad supply currents to provide a unique signature for different across-die variation profiles.
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