Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Anthony S. Polson0
Steven F. Oakland0
Philip S. Stevens0
Gary Grise0
Date of Patent
April 13, 2010
Patent Application Number
11772340
Date Filed
July 2, 2007
Patent Primary Examiner
Patent abstract
A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.
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