Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yenwen Lu0
Jiangwei Li0
Tatsuo Nishibe0
William S. Wong0
Been-Der Chen0
Date of Patent
April 27, 2010
0Patent Application Number
117641280
Date Filed
June 15, 2007
0Patent Citations Received
Patent Primary Examiner
Patent abstract
The method of the invention tracks how the collective movement of edge segments in a mask layout alters the resist image values at control points in the layout and simultaneously determines a correction amount for each edge segment in the layout. A multisolver matrix that represents the collective effect of movements of each edge segment in the mask layout is used to simultaneously determine the correction amount for each edge segment in the mask layout.
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