Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Daniel J. Yaklich0
Warren R. Junker0
Thomas W. Nenno0
Ronald J. Pocratsky0
Date of Patent
May 4, 2010
0Patent Application Number
119540430
Date Filed
December 11, 2007
0Patent Primary Examiner
Patent abstract
A method of synthesizing nondestructive examination data of a component that combines data sets acquired at least two different frequencies. At least one of the data sets is interpolated or extrapolated to the equivalent of data acquired at one of the other frequencies employing a third, reference set of eddy current inspection data that is acquired at each of the inspection frequencies being combined.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
