US Patent 7711515 System and method for automated parameter measurement

In accordance with the present invention, a method for automated parameter measurement includes strategically positioning an identifier tag at a location proximate a first object. The identifier tag stores location-specific information associated with the first object. A sensor in communications with the identifier tag receives the location-specific information from the identifier tag. Additionally, the sensor is used to collect quantitative data associated with a first parameter from the first object. The location-specific information received from the first identifier tag is used to process the quantitative data.