Patent attributes
A method for optimizing a scan chain ordering in circuit designs in an electronic computer-aided design system is provided. The method comprising: creating a schematic representative of a circuit design having a first cell and a second cell, the first cell and the second cell each having latches therein; creating a scan input pin and a scan output pin for each of the latches in the first cell and the second cell on the schematic; generating a first label on the schematic to provide a first wiring arrangement for the latches in the circuit design, the first wiring arrangement identifies a first order to which the scan input of each of the latches is wired to the scan output of another one of the latches; creating a layout representative of the circuit design; generating a first scan chain having a first length on the layout based on the first wiring arrangement; creating a second scan chain from the first scan chain on the layout, the second scan chain having a second length less than the first length of the first scan chain; and generating a second label on the schematic based on the second scan chain, the second label provides a second wiring arrangement for the latches in the circuit design, the second wiring arrangement identifies a second order to which the scan input of each of the latches is wired to the scan output of another one of the latches.
