Patent attributes
A system and method are provided for screening a semiconductor laser. The method includes: (i) operating the laser at a first of a number of drive currents; (ii) acquiring a number (N) of frames of data from a sensor in an optical navigation system (ONS) receiving speckle pattern in light from the laser reflected from a surface proximal to the ONS, the sensor data including differential signal values; (iii) calculating an average differential signal value (AVG) for the N frames of data; (iv) sorting the N frames of data across a plurality of bins including a Bin_0 for frames of data having a differential signal value within a predetermined amount of the AVG; and (v) determining if a number of frames of data in any bins other than Bin_0 exceed a predetermined threshold, and if so recording the drive current.
