Patent attributes
A semiconductor integrated circuit device includes an internal circuit. A plurality of power supply nodes are connected with the internal circuit, and a plurality of pads are respectively connected with the plurality of power supply nodes. A switch section is configured to connect the plurality of power supply nodes one after another in a probe test mode and to separate the plurality of power supply nodes from each other in a product use mode. A power supply voltage is applied to one of the plurality of pads in the probe test mode, and the power supply voltage is applied to each of the plurality of pads in the product use mode. The switch section may include n switches (n is a natural number) provided for the plurality of power supply nodes.
