Patent attributes
A microscopy method is provided for generating an image of an image field passing in a predetermined depth of a sample to be examined, comprising a plurality of illumination steps, in which a part of the image field is in each case illuminated with a focused illumination beam bundle, which effects the generation of sample radiation on account of an interaction with the sample, detection steps, in which the sample radiation generated is detected, and an evaluation step, in which the image is generated on the basis of the sample radiation detected, wherein a first and second detection step are carried out during each illumination step, wherein sample radiation generated at the focus and outside the focus is detected in the first detection step and a smaller proportion of the sample radiation generated at the focus than in the first detection step and also sample radiation generated outside the focus are detected in the second detection step, and wherein the sample radiation detected in the second detection step is used in the evaluation step to reduce the proportion outside the focus in the sample radiation detected in the first detection step.
