US Patent 7732791 Semiconductor testing method and semiconductor tester
Patent 7732791 was granted and assigned to Hitachi on June, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 6, 2007
0
Date of Patent
June 8, 2010
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Patent Application Number
11834207
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Patent Inventor Names
Yasuhiko Nara
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Takeshi Sunaoshi
0
Tohru Ando
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Tsutomu Saito
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Shinichi Kato
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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