US Patent 7733475 Defect inspecting apparatus
Patent 7733475 was granted and assigned to Hitachi on June, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
April 22, 2009
Date of Patent
June 8, 2010
Patent Application Number
12428065
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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