US Patent 7738575 Overlap-and-add with DC-offset correction

A method and system for estimating DC offset and removing the excess DC offset from samples used by an overlap-and-add operation at the receiver of OFDM symbols in UWB communication. The DC offset for each sample within the overlap-and-add interval may be estimated using a sliding window, of the size required for an FFT, operation over past samples. The DC offset may be estimated for a sample within the overlap-and-add interval and updated for the succeeding samples. A size of the overlap-and-add interval may be fixed or may be allowed to vary according to switching characteristics of an analog RF stage preceding the overlap-and-add operation.