US Patent 7739572 Tester for testing semiconductor device
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Patent abstract
A tester for testing a semiconductor device is disclosed. The tester for testing the semiconductor device employs a data selector for converting a logical test pattern data transmitted from a pattern generator into a physical test pattern data and an expected data based on the logical test pattern data, thereby generating various timings based on a time delay instead of using a plurality of clocks to improve a test efficiency and reduce a manufacturing cost.
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US Patent 07739572 Tester for testing semiconductor device US Patent 7739572 Tester for testing semiconductor device
Infobox
Patent Number
0773957200
Patent Number
773957200
Edits on 27 Mar, 2023
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
077395720
Date of Patent
June 15, 2010
0Patent Application Number
117829310
Date Filed
July 25, 2007
0Official Website
Patent Primary Examiner
Edits on 26 Sep, 2022
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
077395720
Date of Patent
June 15, 2010
0Patent Application Number
117829310
Date Filed
July 25, 2007
0Official Website
Patent Primary Examiner
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US Patent 07739572 Tester for testing semiconductor device
Infobox
Is a
Patent jurisdiction
Patent number
07739572
Date of patent
June 15, 2010
Patent application number
11782931
Date Filed
July 25, 2007
Patent primary examiner
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