US Patent 7743299 Dynamically reconfigurable shared scan-in test architecture
Patent 7743299 was granted and assigned to Synopsys on June, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
July 23, 2008
Date of Patent
June 22, 2010
Patent Application Number
12178504
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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