Patent attributes
Systems and methods can automatically inspect a workpiece. Non-destructive inspection sensors are mounted on a frame mounted on a transport device. Position of a first predetermined location of a workpiece is measured with a tracking system. The transport device is moved to position the non-destructive inspection sensors proximate the first predetermined location of a workpiece. A first portion of a workpiece proximate the first predetermined location is non-destructively inspected with the non-destructive inspection sensors. Position of a second predetermined location of a workpiece can be measured with the tracking system. The transport device can be moved to position the non-destructive inspection sensors proximate the second predetermined location of a workpiece, and a second portion of a workpiece proximate the second predetermined location can be non-destructively inspected with the non-destructive inspection sensors. Data can be provided from the sensors to a computing system and analyzed by the computing system.
