Is a
Patent attributes
Current Assignee
0
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kunihiro Tan0
Isao Asano0
Date of Patent
July 20, 2010
0Patent Application Number
116636050
Date Filed
July 13, 2006
0Patent Primary Examiner
Patent abstract
An electronic component device testing apparatus includes first contacts arrayed so that first ends of the first contacts positionally correspond to electrode pads arrayed on a surface of an electronic component device; base electrodes in contact with second ends of the first contacts; and one or more second contacts each being in contact with one of the first contacts at a position which is between the first end and the second end of the one of the first contacts and closer to the first end of the one of the first contacts.
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