US Patent 7764379 Semiconductor laser natural gas analysis system and method
Patent 7764379 was granted and assigned to AXSUN Technologies on July, 2010 by the United States Patent and Trademark Office.
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Patent abstract
A system of gas property monitoring comprises a gas cell for containing a gas of interest and a semiconductor tunable laser spectroscopy system for generating a tunable signal that is transmitted through the gas of interest in the gas cell and detecting the tunable signal after transmission through the gas of interest. An analyzer is provided for relating a spectral response of the gas of interest to a property of interest, such as an energy content of the gas of interest.
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US Patent 07764379 Semiconductor laser natural gas analysis system and method US Patent 7764379 Semiconductor laser natural gas analysis system and method
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Patent Number
0776437900
Patent Number
776437900
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
077643790
Date of Patent
July 27, 2010
0Patent Application Number
116132910
Date Filed
December 20, 2006
0Official Website
Patent Primary Examiner
Edits on 24 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
077643790
Date of Patent
July 27, 2010
0Patent Application Number
116132910
Date Filed
December 20, 2006
0Official Website
Patent Primary Examiner
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US Patent 07764379 Semiconductor laser natural gas analysis system and method
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07764379
Date of patent
July 27, 2010
Patent application number
11613291
Date Filed
December 20, 2006
Patent primary examiner
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