Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Zhaoning Yu0
R. Stanley Williams0
Shih-Yuan Wang0
Wei Wu0
Duncan R. Stewart0
Inkyu Park0
Date of Patent
August 3, 2010
0Patent Application Number
115488230
Date Filed
October 12, 2006
0Patent Primary Examiner
Patent abstract
A contact lithography apparatus and a method use one or both of spacers and a mesa to facilitate pattern transfer. The apparatus and the method include one or both of a spacer that provides a spaced apart orientation of lithographic elements, such as a patterning tool and a substrate, when in mutual contact with the spacer and a mesa between the patterning tool and the substrate. The mesa supports a contact surface of one or both of the mold and the substrate. One or both of the spacers and the mesa may be non-uniform. One or more of the patterning tool, the substrate and the spacer is deformable, such that deformation thereof facilitates the pattern transfer.
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