Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Wei-Cheng Ku0
Jia-Chi Ho0
Jun-Liang Lai0
Te-Chen Feng0
Ai-Chuan Chang0
Chien-Huei Huang0
Chih-Chung Chien0
Chih-Hao Ho0
...
Date of Patent
August 24, 2010
Patent Application Number
12133249
Date Filed
June 4, 2008
Patent Primary Examiner
Patent abstract
A probing device includes a rack that has an outer support member supporting a circuit layer and a center support member supporting a probe assembly. When the tester touching down the circuit layer of the probing device from the top side, the outer support member of the rack bears this touchdown stress. When the probes of the probe holder touching down the electronic components of an IC wafer under test, the center support member of the rack bears the reaction force from the IC wafer.
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