Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yong Liu0
Ralf Schmid0
Sriram Krishnaswami0
William Beaton0
Benjamin M. Johnston0
Hung T. Nguyen0
Ludwig Ledl0
Matthias Brunner0
Date of Patent
August 31, 2010
0Patent Application Number
117465300
Date Filed
May 9, 2007
0Patent Primary Examiner
Patent abstract
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.
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