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US Patent 7786749 Programmable integrated circuit having built in test circuit

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Date Filed
May 19, 2009
Date of Patent
August 31, 2010
Patent Application Number
12468762
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7786749
Patent Primary Examiner
‌
Daniel D Chang

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