US Patent 7802157 Test mode for multi-chip integrated circuit packages
Patent 7802157 was granted and assigned to Micron Technology on September, 2010 by the United States Patent and Trademark Office.
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Patent abstract
When a test mode of a controller of a multi-chip integrated circuit package is activated, external signal lines coupled to the controller are re-mapped to signal lines of one of the integrated circuit devices of the multi-chip integrated circuit package to permit direct testing of the integrated circuit device.
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US Patent 07802157 Test mode for multi-chip integrated circuit packages US Patent 7802157 Test mode for multi-chip integrated circuit packages
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Patent Number
0780215700
Patent Number
780215700
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Official Website
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
078021570
Date of Patent
September 21, 2010
0Patent Application Number
114726180
Date Filed
June 22, 2006
0Official Website
Patent Primary Examiner
Edits on 22 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
078021570
Date of Patent
September 21, 2010
0Patent Application Number
114726180
Date Filed
June 22, 2006
0Official Website
Patent Primary Examiner
Edits on 3 Jun, 2022
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US Patent 07802157 Test mode for multi-chip integrated circuit packages
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07802157
Date of patent
September 21, 2010
Patent application number
11472618
Date Filed
June 22, 2006
Patent primary examiner
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