US Patent 7804314 Adjustable electrical probes for circuit breaker tester

An electrical probe assembly includes a first probe housing pivotally connected to a base structure and receiving a first probe therein. The first probe is configured to interface with a first contact of an electrical component. A second probe housing is pivotally connected to the base structure and receives a second probe therein. The second probe is configured to interface with a second contact of the electrical component wherein the first and second contacts have a spatial relationship therebetween. An adjustment mechanism is connected to the first and second housing and configured to independently adjust an amount of rotation of the each of the housings to accommodate the spatial relationship.