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US Patent 7808638 Scatterometry target and method

Patent 7808638 was granted and assigned to KLA-Tencor on October, 2010 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Current Assignee
KLA-Tencor
KLA-Tencor
0
Date Filed
May 15, 2008
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Date of Patent
October 5, 2010
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Patent Application Number
12121428
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Patent Inventor Names
Christopher F. Bevis
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7808638
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Patent Primary Examiner
‌
Tarifur Chowdhury
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