US Patent 7812619 Capacitance measuring apparatus and capacitance measuring method
Patent 7812619 was granted and assigned to Agilent Technologies on October, 2010 by the United States Patent and Trademark Office.
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Patent abstract
A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before and after voltage fluctuation and the charging current flowing through the device under test as a result of voltage fluctuation.
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US Patent 07812619 Capacitance measuring apparatus and capacitance measuring method US Patent 7812619 Capacitance measuring apparatus and capacitance measuring method
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Patent Number
0781261900
Patent Number
781261900
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Is a
Current Assignee
Patent Jurisdiction
Patent Number
078126190
Date of Patent
October 12, 2010
0Patent Application Number
118911050
Date Filed
August 9, 2007
0Official Website
Patent Primary Examiner
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
078126190
Date of Patent
October 12, 2010
0Patent Application Number
118911050
Date Filed
August 9, 2007
0Official Website
Patent Primary Examiner
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US Patent 07812619 Capacitance measuring apparatus and capacitance measuring method
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07812619
Date of patent
October 12, 2010
Patent application number
11891105
Date Filed
August 9, 2007
Patent primary examiner
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