US Patent 7816930 High temperature range electrical circuit testing
Patent 7816930 was granted and assigned to ON Semiconductor on October, 2010 by the United States Patent and Trademark Office.
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An electrical circuit testing assembly that includes a mechanical reference that is relatively stationary as compared to a circuit under test. A probe support assembly is coupled to the mechanical reference and includes probes for contacting interconnect pads on the circuit under test. Optionally, the probe support structure is attached to the mechanical reference via a column that is thermally resistive. Also optionally, a testing circuitry support structure (e.g., a printed circuit board) is not rigidly attached to the mechanical reference or to the probe support structure, thereby permitting the testing circuitry support structure to float with respect to the probe support structure.
US Patent 07816930 High temperature range electrical circuit testing US Patent 7816930 High temperature range electrical circuit testing
US Patent 07816930 High temperature range electrical circuit testing
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