US Patent 7817485 Memory testing system and memory module thereof

A testing system with data compressing function includes a third data end, a first encoder, and a second encoder. The testing system receives testing data and testing address for testing if any memory cell fails in a memory. The memory includes a first data end, a second end, and an address end. The first encoder encodes the testing data to the data type of the first data end according to the testing address. The second encoder encodes the testing data to the data type of the second data end according to the testing address. In this way, the corresponding memory cells of the first data and second ends store same testing data.