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US Patent 7818601 Method and apparatus for data transfer

Patent 7818601 was granted and assigned to Micron Technology on October, 2010 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Current Assignee
Micron Technology
Micron Technology
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Date Filed
March 4, 2008
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Date of Patent
October 19, 2010
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Patent Application Number
12041755
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Patent Citations Received
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US Patent 12123908 Loopback testing of integrated circuits
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US Patent 11929131 Memory device degradation monitoring
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US Patent 12013800 Die-to-die and chip-to-chip connectivity monitoring
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US Patent 12072376 Die-to-die connectivity monitoring
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US Patent 12092684 Integrated circuit workload, temperature, and/or sub-threshold leakage sensor
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US Patent 11762013 Integrated circuit profiling and anomaly detection
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US Patent 11762789 Integrated circuit I/O integrity and degradation monitoring
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US Patent 11841395 Integrated circuit margin measurement and failure prediction device
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Patent Inventor Names
Paul A. LaBerge
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7818601
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Patent Primary Examiner
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Dennis M. Butler
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