Patent 7831023 was granted and assigned to Siemens Aktiengesellschaft on November, 2010 by the United States Patent and Trademark Office.
A diaphragm system for an x-ray apparatus for scanning an object is provided. The diaphragm system includes a diaphragm support arranged within a radiation path of an x-ray beam. The diaphragm support includes at least two different individual diaphragms. The at least two different individual diaphragms may be controlled as a function of a definable radiation intensity and/or the size of a surface of the object to be irradiated and can be introduced into the radiation path.