US Patent 7840367 Multi-modality inspection system

An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.