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US Patent 7844876 Temperature sampling in electronic devices

Patent 7844876 was granted and assigned to Intel on November, 2010 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 11983431 Read-disturb-based read temperature time-based attenuation system
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US Patent 11928354 Read-disturb-based read temperature determination system
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US Patent 11922035 Read-disturb-based read temperature adjustment system
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Patent abstract

In some embodiments the continuous measuring of temperature in remote memory devices operating within an electrically noisy environment is facilitated by coordinating the progressive approximation of temperature within quiescent periods of non-activity as known by a memory controller.

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Patent Inventor Names
Christopher Cox0
David Wyatt0
Howard David0
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=078448760
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US Patent 07844876 Temperature sampling in electronic devices US Patent 7844876 Temperature sampling in electronic devices

Infobox
Patent Number
078448760
Patent Number
78448760
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Infobox
Is a
Patent
Patent
0
Current Assignee
Intel
Intel
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
078448760
Date of Patent
November 30, 2010
0
Patent Application Number
116481220
Date Filed
December 29, 2006
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=078448760
Patent Primary Examiner
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John P Trimmings
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edited on 3 Jun, 2022
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07844876
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 US Patent 07844876 Temperature sampling in electronic devices

Infobox
Is a
Patent
Patent
Current assignee
Intel
Intel
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07844876
Date of patent
November 30, 2010
Patent application number
11648122
Date Filed
December 29, 2006
Patent primary examiner
‌
John P Trimmings

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