Patent attributes
According to one exemplary embodiment, a method for producing a quality assured semiconductor device model when at least one critical parameter of a semiconductor device process is upgraded includes verifying the quality assured semiconductor device model for consistency against measured data or projected targets. The method further includes verifying the quality assured semiconductor device model for accuracy and consistency when one of a number of critical parameters is varied. The method further includes verifying consistency of the quality assured semiconductor device model against an old semiconductor device model. The method further includes verifying the quality assured semiconductor device model over a range of each of a number of semiconductor device dependencies. The method further includes verifying the quality assured semiconductor device model for digital circuit operation. The method further includes verifying the quality assured semiconductor device model for analog circuit operation. The method further includes verifying convergence of the quality assured semiconductor device model.
