US Patent 7845214 Device and method for optical nanoindentation measurement
Patent 7845214 was granted and assigned to Industrial Technology Research Institute on December, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 28, 2008
0
Date of Patent
December 7, 2010
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Patent Application Number
12230340
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Patent Citations Received
Patent Inventor Names
Hui-Ching Lu
0
Sheng-Jui Chen
0
Chung-Lin Wu
0
Jiong-Shiun Hsu
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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