US Patent 7853849 High-speed serial transfer device test method, program, and device

A test pattern generating unit generates a test pattern in which unconverted data is arranged such that same values of 0 or 1 bits in converted data according to a code conversion table are successively transferred to each of a plurality of serial transfer channels that a high-speed serial transfer device has. A basic pattern setting unit sets a basic pattern while considering a byte order method and an RD value of code conversion in the high-speed serial transfer device. A basic pattern resetting unit resets the basic pattern in accordance with a channel usage method of a bit transfer order in the high-speed serial transfer device. A basic pattern rearranging unit performs rearrangement such that the basic pattern is transferred to each of the channels in accordance with the number of used channels and a channel usage method such as bit transfer order in the high-speed serial transfer device.