US Patent 7861200 Setup and hold time characterization device and method
Patent 7861200 was granted and assigned to Freescale Semiconductor on December, 2010 by the United States Patent and Trademark Office.
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A method of characterizing a device under test (DUT) includes determining a goal function associated with a setup and hold time for the DUT. A minimum value for the goal function is determined by iteratively adjusting setup and hold times for input data to the DUT, and determining whether the DUT performs according to specifications. The minimum goal function value will reflect minimum setup and hold time values based on weights associated with the goal function. This allows the minimum setup and hold times for the DUT to be characterized with a small number of binary searches, improving the speed of the characterization process.
US Patent 07861200 Setup and hold time characterization device and method US Patent 7861200 Setup and hold time characterization device and method
US Patent 07861200 Setup and hold time characterization device and method
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