Patent 7863920 was granted and assigned to Infineon Technologies on January, 2011 by the United States Patent and Trademark Office.
A method of conducting an electrostatic discharge test on an integrated circuit is described. The method comprises configuring a test board assembly to emulate characteristics of a system in which the integrated circuit is to be used, coupling the integrated circuit to the test board assembly, and applying an electrostatic discharge test signal of system-level type to the test board assembly.