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US Patent 7876094 Magnetic field characterization of stresses and properties in materials

Patent 7876094 was granted and assigned to Jentek Sensors, Inc. on January, 2011 by the United States Patent and Trademark Office.

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Patent
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Current Assignee
Jentek Sensors, Inc.
Jentek Sensors, Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7876094
Patent Inventor Names
Vladimir A. Zilberstein0
Vladimir Tsukernik0
Andrew P. Washabaugh0
Darrell E. Schlicker0
David C. Grundy0
Ian C. Shay0
Neil J. Goldfine0
Robert J. Lyons0
Date of Patent
January 25, 2011
Patent Application Number
12080743
Date Filed
April 4, 2008
Patent Citations Received
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US Patent 12111330 Systems and methods for concurrently exposing a test specimen to a first environment and a second environment
0
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US Patent 11710489 Autonomous material evaluation system and method
0
Patent Primary Examiner
Reena Aurora
Reena Aurora
Patent abstract

Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.

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