US Patent 7876879 X-ray tomography inspection systems

An X-ray imaging inspection system for inspecting items comprises an X-ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).