US Patent 7890822 Tester input/output sharing

In one implementation, a method of testing multiple DUTs using a single tester channel is provided which includes providing an input signal with the single tester channel simultaneously to each of the DUTs. The method further includes providing a clock signal to each of the DUTs. The clock signal provided to each of the DUTs may be successively delayed clock signals, which are provided to successive DUTs. The method includes using the clock signal to cause a next DUTs to provide an output transition before an output of a prior DUT is returned to a pre-transition state. The method further includes detecting with the single tester channel the output transition of each of the DUTs in response to the input signal and the clock signal.