US Patent 7894076 Electro-optical measurement of hysteresis in interferometric modulators
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Patent abstract
Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.
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Patent Inventor Names
Brian Gally0
William J Cummings0
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US Patent 07894076 Electro-optical measurement of hysteresis in interferometric modulators US Patent 7894076 Electro-optical measurement of hysteresis in interferometric modulators
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Patent Number
078940760
Patent Number
78940760
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Official Website
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Patent Jurisdiction
Patent Number
078940760
Date of Patent
February 22, 2011
0Patent Application Number
120316020
Date Filed
February 14, 2008
0Official Website
Patent Primary Examiner
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US Patent 07894076 Electro-optical measurement of hysteresis in interferometric modulators
Infobox
Is a
Patent jurisdiction
Patent number
07894076
Date of patent
February 22, 2011
Patent application number
12031602
Date Filed
February 14, 2008
Patent primary examiner
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