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US Patent 7905027 Method and apparatus for probe tip diameter calibration

Patent 7905027 was granted and assigned to Hexagon Metrology, Inc. on March, 2011 by the United States Patent and Trademark Office.

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Patent abstract

A method for determining probe tip diameters with improved accuracy and reliability that includes performing a routine for determining probe tip diameter multiple times with the arm of the coordinate measurement machine in different machine positions. Diameter values associated with each of the calibration routines may be combined in a manner that provides more accurate diameter measurements.

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