Patent attributes
A process in which a white light scanner and a CMM are integrated into one inspection tool. The white light scanner and CMM will be tied to the same table and articulate using the same mechanism. Both inspection processes use the same absolute point to take measurements. The white light data will be modified using the CMM inspection data. Ultimately, the output of the inspection process will be a surface created by the white light inspection with the accuracy of a CMM. The white light scanner first scans the part to determine the surface topography within a first predetermined tolerance. The CMM scanner then scans the part using the coordinates from the white light scanner to position the probe close and fast, and then scans the surface topography of the part with a better tolerance than the white light scanner.
