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US Patent 7907262 Surface shape measurement apparatus and method

Patent 7907262 was granted and assigned to Qinetiq Limited on March, 2011 by the United States Patent and Trademark Office.

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Patent attributes

Current Assignee
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
79072620
Patent Inventor Names
Andrew C Lewin0
Andrew M Scott0
Date of Patent
March 15, 2011
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Patent Application Number
105890750
Date Filed
February 10, 2005
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Patent Primary Examiner
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Tarifur Chowdhury
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Patent abstract

Apparatus for indicating the departure of a shape of an object from a specified shape is described. The apparatus includes a light source for directing an incident beam of radiation onto the object, and an inspecting device for inspecting the final beam after transmission by or reflection from the object. The apparatus is arranged so that the final beam will have a substantially planar wavefront when the object has the specified shape, and said inspecting device is arranged to determine any departure of the wavefront of the final beam from planarity. In one embodiment, the inspecting device includes a beamsplitter, for example a diffraction grating or hologram, and a detector such as a CCD camera. The beamsplitter is then arranged to split the final beam into two or more beams and to direct the two or more beams to laterally displaced locations on the detector.

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