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Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yurii V. Sokhach0
Elena M. Shembel0
Olexandr Kudrevatykh0
Volodymyr Redko0
Date of Patent
March 22, 2011
0Patent Application Number
121527400
Date Filed
May 16, 2008
0Patent Primary Examiner
Patent abstract
The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available.
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