US Patent 7917540 Nonlinear set to set pattern recognition

Variations in the states of patterns can be exploited for their discriminatory information and should not be discarded as noise. A pattern recognition system compares a data set of unlabeled patterns having variations of state in a set-by-set comparison with labeled arrays of individual data sets of multiple patterns also having variations of state. The individual data sets are each mapped to a point on a parameter space, and the points of each labeled array define a subset of the parameter space. If the point associated with the data set of unlabeled patterns satisfies a similarity criterion on the parameter space subset of a labeled array, the data set of unlabeled patterns is assigned to the class attributed to that labeled array.