Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
David Dehnert0
Matthew Heath0
Date of Patent
March 29, 2011
0Patent Application Number
123178720
Date Filed
December 30, 2008
0Patent Primary Examiner
Patent abstract
A test architecture and method of testing are disclosed to allow multiple scan controllers, which control different scan chain designs in multiple logic blocks, to share a test access mechanism. During test mode, the test architecture is configured to decouple clock sources of the test access mechanism, the scan controllers and the scan chains.
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